Scanning Probe Microscopy

Period: Second        ECTS: 4

Course contents

Topic 1 Scanning tunneling microscopy (STM)

Scanning Probe Microscopy (SPM) overview. STM instrumentation. STM applications: characterization and nanomanipulation.

Topic 2 Theory of electronic transport and application to theoretical description of STM

Quantum transport in nanostructures (Landauer formalism, Green’s functions). STM approximations.

Topic 3 Atomic force microscopy (AFM)

AFM instrumentation. AFM applications: characterization and nanomanipulation.

Topic 4 Tip-sample interactions and AFM theory

Types of interaction in AFM: range and intensity. AFM theory.

 Activity 1 Experimental practical sessions on STM and AFM

 Activity 2 Theoretical simulations for STM and AFM


  • BONNEL, D. (ed.): Scanning Probe Microscopy and Spectroscopy: Theory, Techniques and Applications, Second Edition, Wiley, New York (2001).
  • CHEN, C.J.: Introduction to Scanning Tunneling Microscopy, Second Edition, Oxford University Press, Oxford (2008).
  • GÜNTHERODT, H.-J. and WIESENDANGER R. (eds.): Scanning Tunneling Microscopy, Springer, Berlin (1996).
  • MEYER, E., HUG, H. J. AND BENNEWITZ, R.: Scanning Probe Microscopy. The Lab on a Tip, Springer, Berlin (2004).
  • MORITA, S., WIESENDANGER, R. and MEYER, E. (eds.): Noncontact Atomic Force Microscopy, Springer, Berlin (2002).
  • MORITA, S., GIESSIBL, F. J. and WIESENDANGER, R. (eds.): Noncontact Atomic Force Microscopy. Volume 2, Springer, Berlin (2009).
  • SARID, S.: Scanning Force Microscopy, Oxford University Press, Oxford (1994).
  • STROSCIO, J.A. and KAISER W.J. (eds.): Scanning Tunneling Microscopy, Academic Press, San Diego (1993).
  • WIESENDANGER, R.: Scanning Probe Microscopy and Spectroscopy. Methods and Applications, Cambridge University Press, Cambridge (1994).


Coordinator  José María Gómez Rodríguez

More info on the course official guide (Guía docente)